6625-01-085-8037, 6625010858037 (Test Set Semiconduc) - National Stock Number Lookup
NSN 6625-01-085-8037 of part number HTR1005B-1, HTR 1005B, 1005B-1, 1005B by the manufacturer, Huntron Inc is in stock and ready to ship out. We make NSN parts purchasing as simple as possible. We list corresponding components such as 6625-01-085-8037 so that you can make the purchasing decision that is right for you. Our dedicated team are on hand to help source any-hard-find NSN parts or answer any procurement questions. We only source from manufacturers we trust and are the only independent distributor with a NO CHINA SOURCING policy. Unlike other companies, we pair every customer with a dedicated account manager. We respond to all RFQs within 15 minutes. Submit an RFQ today to get started.
6625-01-085-8037 NSN Information
| Alternative NSN: 6625-01-085-8037 |
| Item Name: Test Set Semiconduc |
| FSG: 66 Instruments and Laboratory Equipment |
| NIIN: 010858037 |
| NCB Code: USA (01) |
| Manufacturers: Huntron Inc |
NSN 6625-01-085-8037 Manufacturing Part Numbers
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| HTR1005B-1 | huntron inc | test set semiconduc | Avl | RFQ |
| HTR 1005B | huntron inc | test set semiconduc | Avl | RFQ |
| 1005B-1 | huntron inc | test set semiconduc | Avl | RFQ |
| 1005B | huntron inc | test set semiconduc | Avl | RFQ |
Product Specification of NSN 6625010858037
| MRC | Criteria | Characteristic |
|---|---|---|
| AEJZ | DEPTH | 11.250 INCHES NOMINAL |
| ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| SR-5 | MANUFACTURERS CODE | 57705 |
| FAAZ | PHASE | SINGLE |
| SR-5 | DESIGN CONTROL REFERENCE | HTR 1005B |
| ACZB | FREQUENCY RATING | 60.0 HERTZ NOMINAL |
| SURF | SURFACE TREATMENT | PLASTIC |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | ALTERNATE OPERATING |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | COMPARITOR FUNCTION,CIRCUIT BOARDS WITH INTEGRATED CIRCUITS OR HYBRID CIRCUITS;IN-CIRCUIT TESTING AT LOW,MEDIUM AND HIGH IMPEDANCE;CIRCUIT TESTING FOR CURRENT-LIMITED CIRCUIT PROTECTION;IN-CIRCUIT TEST OF SOLID STATE COMPONENTS;RELIABLE TESTING OF ELECTROLYTIC CAPACITORS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| ANNQ | MATERIAL AND LOCATION | PLASTIC HOUSING |
| AEAS | MAJOR COMPONENTS | TESTER,SOLID STATE;TEST PROBES AND CABLES |
| ABGL | WIDTH | 10.000 INCHES NOMINAL |
| HGTH | HEIGHT | 3.375 INCHES NOMINAL |
| AQXZ | OPERATING TEST CAPABILITY | VISUAL SCOPE DISPLAY PROJECTING IMAGES INDICATING CONDITION OF A DEVICE UNDER TEST |
| SR-5 | THE MANUFACTURERS DATA |
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